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Materials analysis

Arkema Analytical Solutions has a large array of tools for understanding the composition of materials both on the surface and in the bulk. When coupled with our extensive microscopy capabilities, we can provide a complete picture of what is happening inside a material.

Some common analyses include:

  • Surface elemental composition and molecular connectivity
  • X-Y surface mapping and depth profiling
  • Bulk elemental composition
  • Identification of defects
  • Identification of components in multilayer structures
  • Identification of surface treatments
Scanning electron microscopy coupled with energy dispersive X-ray spectroscopy (SEM-EDX) can map surface composition and identify surface contamination
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