X-ray powder diffraction (XRD)

X-Ray powder diffraction (XRD) or wide-angle X-ray scattering (WAXS) analysis is a powerful technique for studying crystalline and semi-crystalline materials.

The XRD analysis method can be applied to materials in powder form, or to manufactured parts, films, plaques, fibers, cured components, coatings, wafers or multilayer systems.


Arkema Analytical Solutions offers state-of-the-art X-ray diffraction (XRD) capabilities which can be used for investigating:

  • Crystalline phase characterization (crystallinity, lattice parameters)
  • Polymorphism (crystalline phase identification)
  • Additives, pigments and fillers identification
  • Active compounds and excipients
  • Preferred orientation or texture
  • Residual stress and strain
  • Detection of preferred orientation in polymers
  • Characterization of thin films (inorganic and organic) on substrates by grazing angle
  • Temperature characterization of phase transformation (-180°C to +300°C)
  • Calculation of crystallite size and strain in crystalline phases (inorganic compounds)