By browsing this website, you accept the use of cookies, which helps us provide you with services and offers matching your centers of interest and compile visitor statistics. More on cookies


Wavelength dispersive X-ray fluorescence (XRF or WDXRF) analysis and inductively coupled plasma spectroscopy (ICP)

Arkema Analytical Solutions offers advanced elemental analysis capabilities such as wavelength dispersive X-ray fluorescence (XRF or WDXRF) and inductively coupled plasma optical emission spectroscopy (ICP or ICP-OES). 

These analytical techniques are powerful tools for detecting and quantifying the elemental composition of the following:  

  • Additives, fillers and pigments
  • Inorganic components in paints
  • Residues
  • Ceramics and clays
  • Metals and alloys
  • Cement, clinker and fly ash
  • Catalysts and zeolites
  • Glass
  • Biological and organic compounds