Wavelength dispersive X-ray fluorescence (XRF or WDXRF) analysis and inductively coupled plasma spectroscopy (ICP)

Arkema Analytical Solutions offers advanced elemental analysis capabilities such as wavelength dispersive X-ray fluorescence (XRF or WDXRF) and inductively coupled plasma optical emission spectroscopy (ICP or ICP-OES). 

These analytical techniques are powerful tools for detecting and quantifying the elemental composition of the following:  

  • Additives, fillers and pigments
  • Inorganic components in paints
  • Residues
  • Ceramics and clays
  • Metals and alloys
  • Cement, clinker and fly ash
  • Catalysts and zeolites
  • Glass
  • Biological and organic compounds