X-ray and elemental analysis
Advanced X-ray and elemental analysis capabilities are applied to a wide variety of problem solving, from probing material microstructure and surface composition to formulation control and reverse engineering of manufactured products and developmental compounds.
The X-ray and elemental analysis capabilities of Arkema Analytical Solutions can help answer the most challenging questions regarding crystalline structure, surface contamination and defects, material composition and trace element quantification, even with only limited quantities of samples.
Our capabilities include:
- Electron spectroscopy for chemical analysis (ESCA) or X-ray photoelectron spectroscopy (XPS)
- X-ray powder diffraction (XRD or XRPD) or wide-angle X-ray scattering (WAXS) analysis
- Wavelength dispersive X-ray fluorescence (XRF or WDXRF) analysis
- Inductively coupled plasma optical emission spectroscopy (ICP or ICP-OES)